comparison sconv_neon.c @ 1:b829afbea564

more testing
author Peter Meerwald <p.meerwald@bct-electronic.com>
date Fri, 20 Apr 2012 14:26:14 +0200
parents e0040ee59c3c
children e889fd0e7769
comparison
equal deleted inserted replaced
0:e0040ee59c3c 1:b829afbea564
101 b[i] = a[i] * invscale; 101 b[i] = a[i] * invscale;
102 } 102 }
103 } 103 }
104 104
105 #define SAMPLES 1019 105 #define SAMPLES 1019
106 #define TIMES 300 106 #define TIMES 10000
107 107
108 static void run_test_from(void) { 108 static void run_test_from(void) {
109 int16_t samples[SAMPLES]; 109 int16_t samples[SAMPLES];
110 int16_t samples_ref[SAMPLES]; 110 int16_t samples_ref[SAMPLES];
111 float floats[SAMPLES]; 111 float floats[SAMPLES];

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