diff sconv_neon.c @ 1:b829afbea564

more testing
author Peter Meerwald <p.meerwald@bct-electronic.com>
date Fri, 20 Apr 2012 14:26:14 +0200
parents e0040ee59c3c
children e889fd0e7769
line wrap: on
line diff
--- a/sconv_neon.c	Thu Jan 12 17:27:46 2012 +0100
+++ b/sconv_neon.c	Fri Apr 20 14:26:14 2012 +0200
@@ -103,7 +103,7 @@
 }
 
 #define SAMPLES 1019
-#define TIMES 300
+#define TIMES 10000
 
 static void run_test_from(void) {
     int16_t samples[SAMPLES];

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